SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

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United States of America

APP PUB NO 20250118594A1
SERIAL NO

18377513

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Abstract

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The semiconductor structure and a manufacturing method thereof are provided. The semiconductor structure includes a first dielectric layer, a first metal layer, a second metal layer, a first etching stop layer, a second etching stop layer, a second dielectric layer, a first via and a second via. The first metal layer and the second metal are embedded in the first dielectric layer. The first etching stop layer is disposed on the first dielectric layer. The second etching stop layer is disposed on the first etching stop layer. The second dielectric layer is disposed on the second etching stop layer. The first via and the second via are embedded in the second dielectric layer. A width of the second etching stop layer is smaller a width of the first etching stop layer.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHANG, Hsiao-Kang Hsinchu, TW 59 103
CHEN, Hsin-Ping Hsinchu, TW 59 108
HUANG, Hsin-Yen Hsinchu, TW 128 185
LEE, Shao-Kuan Hsinchu, TW 95 123
LIAO, Chan-Yu Hsinchu, TW 2 0
LO, Ting-Ya Hsinchu, TW 45 30
SU, Chia-Wei Hsinchu, TW 61 2535
SU, Li-Ling Hsinchu, TW 5 0
WU, Yung-Hsu Hsinchu, TW 62 446

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