STORAGE DEVICE FOR SELECTIVELY PERFORMING HIGH-RELIABILITY PROGRAM OPERATION ACCORDING TO TEMPERATURE, AND OPERATION METHOD OF THE STORAGE DEVICE

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250118371A1
SERIAL NO

18666874

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Abstract

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Provided is a storage device including a memory device including a plurality of memory blocks each including a plurality of memory cells, a controller configured to control a program operation of the memory device in response to a write request received from a host, and a temperature sensor configured to measure an internal temperature, wherein the controller is further configured to, based on a first temperature measured by the temperature sensor, activate one of the plurality of memory blocks as a risk block and then control a high-reliability program operation using the risk block, or activate one of the plurality of memory blocks as a first normal block and then control a normal program operation using the first normal block.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDSUWON CITY KYUNGKI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cha, Sangsoo Suwon-si, KR 6 17
Cheon, Younsoo Suwon-si, KR 9 9
Kwon, Kirock Suwon-si, KR 8 4
Lee, Kwangjin Suwon-si, KR 20 160
Lee, Kyungduk Suwon-si, KR 31 24
Lee, Sewoong Suwon-si, KR 5 1

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