FILM GRAIN MEASUREMENT BASED ON SUBBAND ANALYSIS IN FREQUENCY DOMAIN
Number of patents in Portfolio can not be more than 2000
United States of America
Stats
-
N/A
Issued Date -
Apr 10, 2025
app pub date -
Sep 18, 2024
filing date -
Sep 18, 2024
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
In some embodiments, a method receives a first image and a second image for a comparison of film grain. The first image and the second image are converted from a spatial domain to a frequency domain to generate a first frequency domain representation for the first image and a second frequency domain representation of the second image. The method compares a first distribution of frequency components from the first frequency domain representation to a second distribution of frequency components from the second frequency domain representation. A score for an assessment of differences of the film grain in the first image and the second image is generated based on the comparing.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully