A Film Thickness and Temperature Measuring Device and a Measuring Method Using It
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United States of America
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Apr 10, 2025
app pub date -
Sep 21, 2023
filing date -
Sep 21, 2023
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Abstract
The present disclosure relates to a film temperature and thickness measurement apparatus and a measurement method using the same, which can enable manufacturing of a film with a uniform thickness by sequentially measuring the surface temperature and thickness of a film at the same point of the film that is extruded or coating molded in an in-line method, and through control of the temperature and the thickness of the film based on the measured data.
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