SYSTEM AND METHOD FOR CONFOCAL-CHROMATIC LINE DISTANCE MEASUREMENT

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United States of America

APP PUB NO 20250116506A1
SERIAL NO

18834356

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Abstract

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A system for confocal-chromatic line distance measurement, comprising a line light source (2), an aperture (3), a confocal-chromatic, preferably rotationally symmetrical, measurement lens (6), and a spectrometer (14), preferably a 2D spectrometer, wherein the illumination beam path extends from the light source (2) via the aperture (3) and a first region (5) of the measurement lens (6) to the measurement object (9) and wherein the imaging beam path extends from the measurement object (6) via a second region (11) of the measurement lens (6) to the spectrometer (14). Furthermore, a method for confocal-chromatic line distance measurement is specified.

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Patent Owner(s)

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MICRO-EPSILON OPTRONIC GMBHLESSINGSTRASSE 14 LANGEBRUECK 01465

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GRÜBER, Christoph Dresden, DE 1 0
OTTO, Tobias Dresden, DE 6 5
STAUTMEISTER, Torsten Dresden-Langebrück, DE 6 133

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