LAYER THICKNESS DETERMINATION BY FOUR-WAVE-MIXING SPECTROSCOPY

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United States of America

APP PUB NO 20250116505A1
SERIAL NO

18909189

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Abstract

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A method determines the number of layers in a sample material. The method includes measuring, as a function of two or more wavelengths, a four-wave mixing (FWM) spectrum of the sample material. The method further includes using the FWM spectrum to determine a thickness of the sample material, wherein the thickness is a number of layers in the sample material.

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Patent Owner(s)

Patent OwnerAddress
MONSTR SENSE TECHNOLOGIES LLC3830 PACKARD ST 150 ANN ARBOR MI 48108

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cundiff, Steven T Ann Arbor, US 6 67
Martin, Eric W Saline, US 2 0
Purz, Torben L Nordhorn, DE 2 0

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