MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Apr 10, 2025
app pub date -
Oct 4, 2023
filing date -
Oct 4, 2023
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
An X-ray imaging system, such as a computed tomography (CT) computed tomography (CT) imaging system is provided for material decomposition calibration and intended for use with a calibration phantom. The X-ray imaging system comprises an X-ray source configured to emit X-rays and an X-ray detector arranged in the X-ray beam path configured to generate detector data. The calibration phantom is located in the X-ray beam path. The X-ray imaging system further comprises an X-ray beam limiting device including at least one calibration element in the X-ray beam path. The X-ray imaging system also comprises image processing circuitry configured to acquire projection data for a set of projections based on the detector data, and to determine pathlengths through at least one material of the at least one calibration element and at least one material of the calibration phantom, at least partly based on acquired projection data, for performing material decomposition calibration.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully