MULTIPLE VOLTAGE THRESHOLD INTEGRATED CIRCUIT STRUCTURE WITH LOCAL LAYOUT EFFECT TUNING

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250113595A1
SERIAL NO

18374607

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Abstract

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Multiple voltage threshold integrated circuit structures with local layout effect tuning, and methods of fabricating multiple voltage threshold integrated circuit structures with local layout effect tuning, are described. For example, an integrated circuit structure includes a first fin structure or vertical arrangement of horizontal nanowires. A second fin structure or vertical arrangement of horizontal nanowires is laterally spaced apart from the first fin structure or vertical arrangement of horizontal nanowires. An N-type gate structure is over the first fin structure or vertical arrangement of horizontal nanowires. A P-type gate structure is over the second fin structure or vertical arrangement of horizontal nanowires, the P-type gate structure in contact with the N-type gate structure with a PN boundary between the P-type gate structure and the N-type gate structure. The PN boundary is offset from a central location between the first fin structure or vertical arrangement of horizontal nanowires and the second fin structure or vertical arrangement of horizontal nanowires.

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Patent Owner(s)

Patent OwnerAddress
INTEL CORPORATION2200 MISSION COLLEGE BLVD SANTA CLARA CA 95052

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHAO, Robin Portland, US 24 6
CHU, Tao Portland, US 48 25
HUANG, Chiao-Ti Portland, US 29 4
HUNG, Ting-Hsiang Beaverton, US 19 4
JANG, Minwoo Portland, US 20 4
LIN, Chia-Ching Portland, US 227 960
LIN, Chung-Hsun Portland, US 181 2526
LUO, Yanbin Portland, US 17 13
MURTHY, Anand S Portland, US 351 6235
PACKAN, Paul Hillsboro, US 17 430
XU, Guowei Portland, US 69 186
ZHANG, Feng Hillsboro, US 1002 28040
ZHANG, Yang Rio Rancho, US 898 4769

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