MEMORY STRUCTURE AND MANUFACTURING METHOD THEREOF

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250113488A1
SERIAL NO

18494747

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Abstract

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Provided are a memory structure and a manufacturing method thereof. The memory structure includes a substrate having first and second regions, first and second isolation structures in the substrate, a charge storage layer on the substrate, first and second gates and doped regions. The first isolation structures define first active areas in the first region. A top surface of the first isolation structure is higher than that of the substrate. The second isolation structures define second active areas in the second region. A top surface of the second isolation structure is lower than that of the substrate. The first gate is on the charge storage layer in the first active area. The second gate is on the charge storage layer in the second active area. The doped regions are in the substrate at two sides of the first gate and at two sides of the second gate.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPNO 3 LI-HSIN ROAD 2 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU CITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chien-Hung Hsinchu City, TW 395 1635
Chou, Ling Hsiu Tainan City, TW 4 0
Hsu, Chih-Yang Tainan City, TW 20 50
Hsueh, Jen Yang Tainan City, TW 4 0
Huang, Chia-Hui Tainan City, TW 13 36
Wang, Chia-Wen Tainan City, TW 16 39

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