DETECTING SENSOR DEFECTS FOR THREE-DIMENSIONAL TIME-OF-FLIGHT SENSORS
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United States of America
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Apr 3, 2025
app pub date -
Sep 28, 2023
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Sep 28, 2023
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Abstract
Described herein are systems and techniques for evaluating whether components of a sensing device are functioning properly. An example method includes obtaining a first set of measurements corresponding to a pixel from a first image frame captured by a sensor, wherein each respective measurement from the first set of measurements is associated with a different signal phase; converting the first set of measurements using an analog to digital converter (ADC) to yield a first set of digitized measurements; and determining, based on the first set of digitized measurements, a first confidence map value that corresponds to the pixel from the first image frame, wherein the first confidence map value is indicative of at least one defect in the sensor.
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