ON-CHIP NOISE MEASUREMENT IN A TRANSCEIVER, METHOD AND SYSTEM THEREOF

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250112663A1
SERIAL NO

18418336

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Abstract

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According to an aspect, a transceiver comprises a transmitter section having a first PLL (phased locked loop) providing a first reference signal to the transmitter section, a receiver section having a second PLL providing a second reference signal to the receiver section, a coupler coupling the second PLL to the transmitter section when the transceiver is operative in a test mode measuring a first noise component introduced by the first PLL. The first reference signal is coupled to the receiver section internally within the transceiver as a local reference signal to the receiver section both in the test mode and a functional mode.

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Patent Owner(s)

Patent OwnerAddress
RENESAS ELECTRONICS CORPORATION2-24 TOYOSU 3-CHOME KOTO-KU TOKYO 135-0061

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Joshi, Alok Prakash Bengaluru, IN 14 38
Rajendran, Gireesh Bengaluru, IN 59 413
Zhishan, Xu Tokyo, JP 1 0

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