CRYO-ELECTRON MICROSCOPY IMAGE PROCESSING METHOD AND APPARATUS, TERMINAL, AND STORAGE MEDIUM

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United States of America

APP PUB NO 20250112021A1
SERIAL NO

18891450

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Abstract

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The present disclosure provides a cryo-electron microscopy image processing method and apparatus, a terminal, and a storage medium. The cryo-electron microscopy image processing method includes: obtaining a cryo-electron microscopy image; encoding the cryo-electron microscopy image into latent variables through an encoder; converting the latent variables into an atomic model structure through a decoder; correcting the atomic model structure using a loss function to obtain a corrected atomic model structure, where the loss function includes a bond length constraint loss function, a clash constraint loss function, and a spring constraint loss function; and converting, through a projector module, the corrected atomic model structure into a density map represented by Gaussian spheres, and projecting the density map to obtain a projection image.

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Patent Owner(s)

Patent OwnerAddress
BEIJING YOUZHUJU NETWORK TECH CO LTD中国北京市平谷区林荫北街13号信息大厦802室 BEIJING 101299 101299

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GU, Quanquan Los Angeles, US 1 0
LI, Yilai Los Angeles, US 2 0
YE, Fei Beijing, CN 114 1151
YUAN, Jing Beijing, CN 135 622
ZHOU, Yi Beijing, CN 360 1976

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