STANDARD CELL SPACING QUALITY CHECKING

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250111123A1
SERIAL NO

18476922

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Abstract

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A method for checking standard cell spacing in a design includes providing a first standard cell. A cell environment of the first standard cell is determined and a first feasible distance between a first boundary of the standard cell and a boundary of a first adjacent cell based on the cell environment is determined. A second feasible distance between a second boundary of the standard cell and a boundary of a second adjacent cell based on the cell environment is determined. A feasible spacing between the first standard cell and a second standard cell is provided, and the feasible spacing is evaluated based on the first feasible distance, the second feasible distance and a cell pitch of the first standard cell. An integrated circuit is fabricated that includes the first standard cell in response on the evaluating.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTDHSIN-CHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Wen-Hao Hsinchu, TW 112 704
Lu, Yu-Sheng New Taipei City, TW 7 169
Ou, Hung-Chih Kaohsiung City, TW 26 51

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