A METHOD FOR CHARACTERIZING RADIOFREQUENCY INTERFERENCE CAUSED BY A PLURALITY OF SOURCES, AN OBSERVING DEVICE, A SYSTEM, AND A COMPUTER PROGRAM

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United States of America Patent

APP PUB NO 20250105934A1
SERIAL NO

18727128

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Abstract

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The disclosure relates to characterizing radiofrequency interference caused by a plurality of sources. At least one observing device is used for scanning successively a plurality of radiofrequency bands for performing interference measurements in the plurality of radiofrequency bands, in different space locations, and at different time instants, and provides observations at successive time instants of a current position of the observing device, and a received interference power in an observed frequency band. For each interference source and each observation, a likelihood probability to attribute one observation to one interference source is computed. This likelihood probability computations are used for assigning each of said observations to one interference source. More particularly, the likelihood probability computing is based on both frequency observation and interference power observation.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI ELECTRIC CORPORATION7-3 MARUNOUCHI 2-CHOME CHIYODA-KU TOKYO 1008310 ?1008310

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GRESSET, Nicolas RENNES Cedex 7, FR 97 495
NGUYEN, Viet Hoa RENNES Cedex 7, FR 3 0

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