AI-BASED APPARATUS AND METHOD FOR DETECTING A DEFECT OF A PRODUCT

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United States of America Patent

APP PUB NO 20250104829A1
SERIAL NO

18972874

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Disclosed is an AI-based apparatus for detecting a defect of a product. The AI-based apparatus includes: a sensor unit which photographs a product to generate image data and measures at least one of a color, a saturation, a brightness, a transparency, and a reflectance of the product; and a detection unit which detects a defect on the product by inputting the image data to a convolutional neural network (CNN) trained to detect a defect on a product surface. Also, the number of convolution layers of the convolutional neural network is determined based on a defect detection difficulty determined according to at least one of the color, the saturation, the brightness, the transparency, and the reflectance of the product and a defect type.

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Patent Owner(s)

Patent OwnerAddress
INTER X CO LTDI0F 7 JONGGA 6-GIL JUNG-GU ULSAN 44542

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
JUNG, Ha Il Ulsan, KR 11 0
PARK, Jeong Hyun Ulsan, KR 54 125
PARK, Jung Ywn Ulsan, KR 11 0

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