Photoresist and Method
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United States of America Patent
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Issued Date -
Mar 27, 2025
app pub date -
Dec 9, 2024
filing date -
Dec 9, 2024
priority date (Note) -
Published
status (Latency Note)
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Abstract
Multi-layer photoresists, methods of forming the same, and methods of patterning a target layer using the same are disclosed. In an embodiment, a method includes depositing a reflective film stack over a target layer, the reflective film stack including alternating layers of a first material and a second material, the first material having a higher refractive index than the second material; depositing a photosensitive layer over the reflective film stack; patterning the photosensitive layer to form a first opening exposing the reflective film stack, patterning the photosensitive layer including exposing the photosensitive layer to a patterned energy source, the reflective film stack reflecting at least a portion of the patterned energy source to a backside of the photosensitive layer; patterning the reflective film stack through the first opening to form a second opening exposing the target layer; and patterning the target layer through the second opening.

First Claim
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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
TAIWAN SEMICONDUCTOR MFG CO LTD | NO 8 LI-HSIN RD 6 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU |
International Classification(s)

- [Classification Symbol]
- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Chang, Liang-Yi | Hsinchu, TW | 12 | 8 |
Chui, Chi On | Hsinchu, TW | 525 | 1267 |
Huang, Tai-Chun | Hsinchu, TW | 170 | 1430 |
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