REFLECTIVE MASK BLANK AND MANUFACTURING METHOD OF REFLECTIVE MASK

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United States of America Patent

APP PUB NO 20250102898A1
SERIAL NO

18823930

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An absorption film of a reflective mask blank that is formed on a protection film and can be etched by ion beam etching or methanol etching is patterned by providing an etching prevention film contacted with both of the protection film and the absorption film, and a first hard mask film on the absorption film, and patterning the absorption film by ion beam etching or methanol etching with using a pattern of the first hard mask film as an etching mask.

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Patent Owner(s)

Patent OwnerAddress
SHIN-ETSU CHEMICAL CO LTD4-1 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 100-0005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ISHII, Takeshi Joetsu-shi, JP 104 635
KANEKO, Hideo Joetsu-shi, JP 98 438
MIMURA, Shohei Joetsu-shi, JP 16 76
SAKURAI, Keisuke Joetsu-shi, JP 7 0

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