APPARATUS AND METHODS FOR PERFORMING AN IN-SITU ETCH OF REACTION CHAMBERS WITH FLUORINE-BASED RADICALS

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United States of America Patent

APP PUB NO 20250101581A1
SERIAL NO

18973788

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Abstract

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An apparatus and method for cleaning or etching a molybdenum film or a molybdenum nitride film from an interior of a reaction chamber in a reaction system are disclosed. A remote plasma unit is utilized to activate a halide precursor mixed with an inert gas source to form a radical gas. The radical gas reacts with the molybdenum film or the molybdenum nitride film to form a by-product that is removed from the interior of the reaction chamber by a purge gas.

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Patent Owner(s)

Patent OwnerAddress
ASM IP HOLDING B VVERSTERKERSTAAT 8 ALMERE 1322 AP

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mishra, Amit Tempe, US 83 244
Oosterlaken, Theodorus GM Oudewater, NL 52 2956
Swaminathan, Shankar Phoenix, US 111 12669
Zope, Bhushan Phoenix, US 25 2536

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