ERROR CONDITION MONITORING IN MEMORY SYSTEMS

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250095765A1
SERIAL NO

18369014

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Abstract

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This application is directed to data validation in an electronic device having a memory device. The memory device receives an inquiry for a validity condition of a page of the memory device from a memory controller that is coupled to the memory device in a memory system. In response to the inquiry, the memory device selects a subset of the page of the memory device to represent the page. The subset of the page stores a set of memory data. The memory device obtains integrity data corresponding to the set of memory data, applies a plurality of validation operations on the set of memory data and the integrity data corresponding to the set of memory data to generate a plurality of validity results. The memory device determines an error parameter of the page locally based on the plurality of validity results and provides the error parameter to the memory controller.

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Patent Owner(s)

Patent OwnerAddress
SK HYNIX INCGYEONGGI DO SOUTH KOREA GYEONGGI-DO
SK HYNIX NAND PRODUCT SOLUTIONS CORP (DBA SOLIDIGM)10951 WHITE ROCK ROAD RANCHO CORDOVA CA 95670

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HUANG, Pengfei San Jose, US 14 10
KWOK, Zion Burnaby, CA 14 17
ZHANG, Fan San Jose, US 973 7171

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