INTERFEROMETRIC SCATTERING MICROSCOPY

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250093633A1
SERIAL NO

18971420

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Abstract

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An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.

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Patent Owner(s)

Patent OwnerAddress
OXFORD UNIVERSITY INNOVATION LIMITEDBUXTON COURT 3 WEST WAY OXFORD OX2 0JB

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BENESCH, Justin Oxford, GB 5 6
KUKURA, Philipp Oxford, GB 9 20
WEIGEL, Alexander Garching Bei Munchen, DE 8 14

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