PROBE UNIT AND CHARGE/DISCHARGE INSPECTION DEVICE

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250093420A1
SERIAL NO

18968485

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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Provided is a probe unit for a charge/discharge inspection device that includes: a first probe holding plate on which one or more positive-electrode probes are arranged in order; and a second probe holding plate that is opposite to the first probe holding plate and on which one or more negative-electrode probes are arranged in order so as to correspond to the one or more positive-electrode probes, wherein the first probe holding plate or/and the second probe holding plate are attached so as to be movable in a direction toward each other and a direction away from each other. In particular, the probe unit includes a first moving mechanism that moves the first probe holding plate or/and the second probe holding plate in the direction toward each other and the direction away from each other.

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Patent Owner(s)

Patent OwnerAddress
NIPPON STEEL TEXENG CO LTD5-2 MARUNOUCHI 2-CHOME CHIYODA-KU TOKYO 100-0005

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HARAGUCHI, Tomoki Tokyo, JP 2 0
ISHIBASHI, Teruhito Tokyo, JP 2 0
SAITO, Shigeru Tokyo, JP 101 1092

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