SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF METAL ELEMENTS
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United States of America
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Mar 20, 2025
app pub date -
Dec 3, 2024
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Dec 3, 2024
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Abstract
Provided is a subcellular self-tracer ion imaging and localization method of metal elements. Wherein, the above method includes: using the SEM-FIB-TOF-SIMS system to perform subcellular structure imaging and metal ion imaging on the sample slice, wherein in the SEM-FIB-TOF-SIMS system, the scanning electron microscope (SEM) is used to perform subcellular structure imaging on the sample slice; and the focused ion beam (FIB) is used to perform surface bombardment on the subcellular structures, and the secondary ions excited are detected by the time-of-flight secondary ion mass spectrometry (TOF-SIMS) to obtain the ion information in the analysis area and imaged.
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