METHOD FOR DETERMINING A CENTER POSITION OF A TRANSFERRED SEMICONDUCTOR PART AND A SYSTEM FOR DETERMINING THE SAME

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United States of America

APP PUB NO 20250087511A1
SERIAL NO

18789596

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Abstract

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Provided is a method for determining a center position of a transferred semiconductor part including: disposing at least one pair of component detecting sensors at a transferring path of the semiconductor part; detecting different portions of the semiconductor part by each component detecting sensor; calculating a centering position of the semiconductor part based on the detected different portions; and fixing the semiconductor part at a designated position based on the calculating result.

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Patent Owner(s)

Patent OwnerAddress
VM INC352-1 ICHI-RI MAJANG-MYEON GYEONGGI-DO ICHEON

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHOI, Woo Hyung Seongnam-si, KR 14 1
KWON, Tae Jin Anseong-si, KR 2 0
LEE, Sang Woo Suwon-si, KR 148 1013

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