MONITORING DEVICE FOR MEASURING CHARACTERISTICS OF EDGE AREA AND METHOD OF MANUFACTURING THE SAME

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250087508A1
SERIAL NO

18963001

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A monitoring device for measuring characteristics of an edge area of an object to be measured and a method of manufacturing the same are disclosed. The monitoring device comprises a lower cover, a guide member disposed on the lower cover, a circuit module in which at least one electrical element is disposed on a circuit board and an upper cover disposed on the guide member or the circuit module. Here, a space is formed at the guide member, and at least partial of the circuit module locates in the space.

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Patent Owner(s)

Patent OwnerAddress
FINE SEMITECH CORP#15-23 DONGTAN INDUSTRIAL COMPLEX 6-GIL DONGTAN-MYEON HWASEONG SI GYEONGGI-DO
WIT CORPORATION15-23 DONGTANSANDAN 6-GIL HWASEONG-SI GYEONGGI-DO 18487

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KIM, Jae Hwan Hwaseong-si, KR 96 672
OH, Jae Won Gunpo-si, KR 10 24

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