Characterizing Fault Injection on Power Distribution Networks with Voltage Sensors

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United States of America

APP PUB NO 20250076955A1
SERIAL NO

18951018

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Abstract

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Power and electromagnetic fault injection vulnerabilities in an integrated circuit (IC) can be characterized sampling one or more integrated timing sensors in real-time or by equivalent-time sampling. To achieve equivalent-time sampling, a series of fault injection attempts are performed. An array of timing sensors implemented in part of the IC capture a measure of relative propagation delay, which fluctuates proportionally with instantaneous voltage. Increased voltage fluctuation can indicate elevated probability of faults in digital logic. Related apparatus, systems, techniques and articles are also described.

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Patent OwnerAddress
MITRE CORPORATION7515 COLSHIRE DRIVE MCLEAN VA 22102

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bainbridge, Rachel Bedford, US 3 65
Chapman, Joe Bedford, US 4 22
Marquis, Brian D Bedford, US 2 0
Paquette, Michael J Bedford, US 10 149

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