TERAHERTZ SPECTROSCOPY SYSTEM

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250076192A1
SERIAL NO

18697737

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present application discloses a measurement unit for holding a sample (including a powder sample in small quantity, a scattered powder sample or an aqueous solution sample) for a terahertz beam irradiation; and a terahertz spectroscopy system with the measurement unit for measuring an absorption signal from the sample. In particular, the terahertz beam can be reflected for multiple times through the sample in the measurement unit for enhancing the absorption signal. The present application discloses three non-destructive e methods of measuring the absorption signal of the sample using the terahertz. spectroscopy system.

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Patent Owner(s)

Patent OwnerAddress
ANOR TECHNOLOGIES PTE LTD73 AYER RAJAH CRESCENT #03-13/14 SINGAPORE 139952

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GU, Haiwen Singapore, SG 3 0
ZHANG, Nan Singapore, SG 491 2425

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