SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME

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United States of America

APP PUB NO 20250063789A1
SERIAL NO

18449911

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Abstract

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A method for forming a semiconductor device structure includes forming nanostructures over a substrate. The method also includes forming a gate structure wrapped around the nanostructures. The method also includes forming source/drain epitaxial structures over opposite sides of the nanostructures. The method also includes forming a first interlayer dielectric structure over the source/drain epitaxial structures. The method also includes removing the first interlayer dielectric structure. The method also includes forming a recess in the source/drain epitaxial structures. The method also includes forming a silicide structure in the recess. The method also includes forming a second interlayer dielectric structure over the silicide structure.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTDNO 8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHANG, Shih-Hsun Hsinchu, TW 62 244
CHEN, Hong-Chih Changhua County, TW 17 10
HSU, Je-Wei Hsinchu City, TW 6 29
KUO, Chia-Hao Taoyuan City, TW 26 81
SU, Fu-Hsiang Zhubei City, TW 25 68
WU, Ping-Chun Hsinchu City, TW 13 1

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