REFLECTIVE MASK BLANK AND MANUFACTURING METHOD OF REFLECTIVE MASK

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United States of America

APP PUB NO 20250060658A1
SERIAL NO

18793284

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Abstract

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As a reflective mask blank that includes a protection film containing ruthenium (Ru), a reflective mask blank in which the protection film is hard to be damaged and can be suppressed decrease of the thickness is provided by a reflective mask blank including a substrate, a multilayer reflection film, a protection film, an absorption film, and an etching prevention film that contains niobium (Nb) and is free of ruthenium (Ru) between the protection film and the absorption film.

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Patent Owner(s)

Patent OwnerAddress
SHIN-ETSU CHEMICAL CO LTD4-1 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 100-0005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
INAZUKI, Yukio Joetsu-shi, JP 113 794
KANEKO, Hideo Joetsu-shi, JP 98 438
KOSAKA, Takuro Joetsu-shi, JP 52 118
MIMURA, Shohei Joetsu-shi, JP 16 76
OGOSE, Taiga Joetsu-shi, JP 9 1
SAKURAI, Keisuke Joetsu-shi, JP 7 0

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