DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250060410A1
SERIAL NO

18937072

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Abstract

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A delay measurement system and a measurement method are provided. The delay measurement system includes a delay control device and a comparator. The delay control device is configured to generate a second signal in response to a first signal, wherein a rising edge of the second signal delays a first delay time with respect to a rising edge of the first signal, and the first delay time is controlled in response to an output signal of a comparator. The comparator is configured to compare the first delay time with a second delay time and output the output signal, wherein a rising edge of a third signal delays the second delay time with respect to the rising edge of the first signal, and the third signal is generated by a device under test (DUT) in response to the first signal.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHANG, CHIH-CHIANG TAIPEI CITY, TW 251 1515
PENG, YUNG-CHOW HSINCHU, TW 205 737
YANG, CHUNG-CHIEH HSINCHU COUNTY, TW 66 264
YANG, SHANG HSIEN HSINCHU CITY, TW 2 0

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