PREDICTION DEVICE, TEST SYSTEM, PREDICTION METHOD, AND PREDICTION PROGRAM
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United States of America
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Issued Date -
Feb 20, 2025
app pub date -
Dec 15, 2022
filing date -
Dec 15, 2022
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Abstract
Information for realizing an efficient transfer schedule by the transfer section is provided. A prediction device includes a calculation unit configured to calculate a test time length when a test of a wafer has been performed by a tester; a test time prediction unit configured to predict a current test time length based on past test time lengths calculated by the calculation unit; an end time prediction unit configured to predict, when a start time of a test of a test target wafer by the tester is acquired, an end time of the test of the test target wafer based on the predicted test time length; and a storage unit configured to store at least the predicted test time length and the predicted end time in a readable manner.
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