TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT
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United States of America
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Issued Date -
Feb 20, 2025
app pub date -
Feb 6, 2024
filing date -
Feb 6, 2024
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Abstract
A test device for an optoelectronic integrated circuit includes a circuit board, a connecting base, a first light transmission component, and a second light transmission component. The connecting base is arranged on the circuit board and includes a carrier board and a frame. The optoelectronic integrated circuit is arranged on a carrier surface of the carrier board. The first light transmission component is arranged on a side of the frame, includes a first transmission portion, and is located at a first vertical level with respect to the carrier surface. The second light transmission component is arranged on another side of the frame, includes a second transmission portion, and is located at a second vertical level with respect to the carrier surface. A height of the second vertical level is different from a height of the first vertical level.
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