SYSTEMS, APPARATUSES, AND METHODS FOR SAMPLE CYLINDER INSPECTION, PRESSURIZATION, AND SAMPLE DISPOSAL

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250060288A1
SERIAL NO

18936824

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Systems, apparatuses, and methods for enhancing handling of a sample cylinder may include first, second, and third stations, each configured to receive a sample cylinder containing a material sample. The first station may include a first mounting fixture configured to be attached to the sample cylinder, a viewing glass to facilitate inspection of a portion of the material sample, and a first valve configured to remove a portion of the material sample from the sample cylinder. The second station may include a second mounting fixture and a second valve to provide fluid flow between a source of pressurized gas and the sample cylinder, thereby to pressurize the sample cylinder. The third station may include a third mounting fixture configured to be attached to the sample cylinder and a third valve to provide fluid flow between the sample cylinder and ventilation ductwork or a receptable.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bender,, IV Gregory D Findlay, US 4 33
Chauvin, Jason M Findlay, US 4 33
Jones, Heath B Findlay, US 2 1
Langenfeld, John J Findlay, US 4 33
Markins, Alex M Findlay, US 4 33
Spence, David S Findlay, US 3 13
Triche, Nicci R Findlay, US 2 1
Williams, Masaru F Findlay, US 2 1

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