METHOD OF GRINDING WAFER

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250058422A1
SERIAL NO

18787386

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Abstract

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After a first recess whose bottom is of a shape represented by a side surface of an inverted cone is formed in a reverse side of a wafer and before a second recess whose bottom is of a circular shape is formed in the reverse side of the wafer, a chuck table and a spindle are spaced from each other to separate a plurality of grindstones and the reverse side of the wafer from each other, and then a tilt of at least one of the chuck table or the spindle is adjusted to change an angle formed between a rotational axis about which the chuck table is rotatable and a rotational axis about which the spindle is rotatable.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
FUJII, Yusuke Tokyo, JP 179 908
SUZUKI, Yoshikazu Tokyo, JP 119 536

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