OFFSET CALIBRATION FOR SIGNAL RMS MEASUREMENT

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250055431A1
SERIAL NO

18230767

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Abstract

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Offset calibration for signal rms measurement is provided. A method includes determining a first offset calibration of a first differential pair of a circuit. The first differential pair comprises a first transistor and a second transistor. The method also includes determining a second offset calibration of a second differential pair of the circuit. The second differential pair comprises a third transistor and a fourth transistor. Further, the method includes, based on the first offset calibration and the second offset calibration, determining a third offset calibration of a common mode.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bisanti, Biagio Lowell, US 15 204
Ugolini, Jonathan Lowell, US 3 0

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