SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DIAGNOSTIC DEVICE
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United States of America
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Issued Date -
Feb 13, 2025
app pub date -
Aug 6, 2024
filing date -
Aug 6, 2024
priority date (Note) -
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Abstract
The technology provided enables the acceleration of the clock. The semiconductor device comprises a counter circuit configured to generate a read signal when the count number reaches a predetermined number, a buffer configured to store test data and sequentially output the test data in the order stored when the read signal indicates a valid value, and a first scan test circuit that sequentially captures the test data output from the buffer.
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