CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDING PROBE HEAD
Number of patents in Portfolio can not be more than 2000
United States of America
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Issued Date -
Feb 13, 2025
app pub date -
Dec 19, 2022
filing date -
Dec 19, 2022
priority date (Note) -
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status (Latency Note)
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Abstract
A contact probe is disclosed having a first end portion which ends with a contact tip configured to abut onto a contact pad of a device under test and a second end portion which ends with a contact head configured to abut onto a contact pad of a board of a testing apparatus, as well as a probe body extended between the first end portion and the second end portion along with a longitudinal development axis The first end portion includes a first support part, interposed between the probe body and the contact tip. Suitably, the first support part includes at least one contact pin and one probe length which extend parallel to each other along the longitudinal development axis and are separated by an air gap.
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