SYSTEM AND METHOD FOR CALIBRATING WEIGHTING ERRORS IN SPLIT CAPACITANCE SUCCESSIVE APPROXIMATION ANALOG-TO-DIGITAL CONVERTERS

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United States of America

APP PUB NO 20250047291A1
SERIAL NO

18472717

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Abstract

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The present disclosure relates to the field of microelectronics and solid-state electronics, and in particular to a calibration system and method for weighting errors brought about by parasitic capacitance in split capacitor-based successive approximation analog-to-digital converters. The method uses an MSB array that does not add additional capacitors, only a switch SM to reduce the comparator design difficulty. Meanwhile, an LSB array may add a calibration DAC array CA including a binary array of P-bit unit capacitors, a calibration structure Cfraq, and a ground switch Sk. The calibration structure Cfraq includes four unit capacitors and two switches S1 and S2. By controlling the switches S1 and S2 different capacitance values can be generated to reduce the chip area consumption. This structure can reduce the error to LSB/4 and the weighting error of the ADC, and increases the effective number of bits of the ADC without excessively increasing comparator gain.

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Inventor Name Address # of filed Patents Total Citations
FAN, Hua Chengdu, CN 67 315
FENG, Quanyuan Chengdu, CN 6 1
LIU, Yilin Chengdu, CN 21 44
LUO, Jing Chengdu, CN 133 599
ZHANG, Wei Chengdu, CN 2625 19909
ZHAO, Panfeng Chengdu, CN 2 0

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