INSPECTION SYSTEM AND INSPECTION METHOD
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United States of America
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Feb 6, 2025
app pub date -
Jul 6, 2022
filing date -
Jul 6, 2022
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Abstract
An inspection system and method, the inspection system includes: a carrying device, at least one ray source and a detector assembly. The ray source and the detector assembly are lifted or lowered along a central axis of the carrying device relative to the carrying device. When viewed along the central axis, the ray source is translatable between scanning positions relative to the carrying device. When the ray source is at one of the scanning positions the ray source and the detector assembly are lifted or lowered relative to the carrying device along the central axis, and the ray source emits X-rays; and when the ray source and the detector assembly are lifted or lowered a predetermined distance the ray source translates to another scanning position. The inspection system further reconstructs a three-dimensional scanning image of the object to be inspected based on detection data of the detector assembly.
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