SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF AND MEMORY SYSTEM

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United States of America

APP PUB NO 20250040125A1
SERIAL NO

18513260

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Abstract

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Semiconductor structures, fabrication methods thereof, and memory systems are provided. In one aspect, a method of forming a semiconductor structure includes: forming a plurality of first trenches in a semiconductor base from a surface of the semiconductor base, forming a plurality of gate structures in the plurality of first trenches, forming a plurality of second trenches in the semiconductor base, and forming a plurality of isolation structures in the plurality of second trenches. The plurality of first trenches extend along a first direction. Each of the plurality of second trenches is between two adjacent trenches of the plurality of first trenches, and the plurality of second trenches extend along the first direction.

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Patent Owner(s)

Patent OwnerAddress
YANGTZE MEMORY TECHNOLOGIES CO LTDNO 88 WEILAI 3RD ROAD EAST LAKE HIGH-TECH DEVELOPMENT ZONE WUHAN HUBEI 430000

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HUO, Zongliang Wuhan, CN 232 1124
TANG, Zhaoyun Wuhan, CN 15 13
ZHOU, Wenbin Wuhan, CN 62 161

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