MEMORY ERROR PREDICTION METHOD AND APPARATUS, AND DEVICE

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250036514A1
SERIAL NO

18917723

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Abstract

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This application discloses a memory error prediction method and apparatus, and a device. After memory error data is obtained, a prediction area affected by a memory error and a time range in which the memory error occurs in the prediction area are determined based on time and space information that reflects the memory error and a memory physical structure. In this way, a location at which the error occurs in the memory and time at which the error occurs in the memory are determined based on the memory error data, and a potential risk area affected by the memory error and a time range in which the error occurs in the potential risk area are deeply analyzed from a perspective of a hardware structure with reference to the connection relationship that is between the memory cells and that is indicated by the memory physical structure.

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Patent Owner(s)

Patent OwnerAddress
HUAWEI TECH CO LTDHUAWEI ADMINISTRATION BUILDING BANTIAN LONGGANG SHENZHEN GUANGDONG 518129 CHINA CN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dong, Weiwei Hangzhou, CN 3 0
Gu, Xinli Shenzhen, CN 9 58
Luo, Jiaqi Kunshan, CN 1 0
Tang, Kun Chengdu, CN 46 107
Wan, Jun Chengdu, CN 134 2467
Xu, Shixin Kunshan, CN 8 33

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