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Abstract

Aluminum alloy ingot containing Cu: 0.3 to 1.0 mass %, Mg: 0.6 to 1.2 mass %, Si: 0.9 to 1.4 mass %, Mn: 0.4 to 0.6 mass %, Fe: 0.1 to 0.7 mass %, Cr: 0.09 to 0.25 mass %, and Ti: 0.012 to 0.035 mass %, and in an X-ray diffraction pattern measured using Cu-Kα rays, a peak height of a diffraction peak at a diffraction angle 2θ of 41.6 to 42.0° is a value smaller than 6 times a standard deviation of a background X-ray intensity in a range of a full width at half maximum of the diffraction peak, and in a heat-treated product after heating at 450° C. for 1 hour, a peak height of the diffraction peak at a diffraction angle 2θ of 41.6 to 42.0° is 15 times or more a standard deviation of the background X-ray intensity in the range of a full width at half maximum of the diffraction peak.

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First Claim