SEMICONDUCTOR DEVICE AND METHOD FOR THERMAL DISSIPATION

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United States of America Patent

APP PUB NO 20250031413A1
SERIAL NO

18354513

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Abstract

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Method to implement heat dissipation multilayer and reduce thermal boundary resistance for high power consumption semiconductor devices is provided. The heat dissipation multilayer comprises a first crystalline layer that possesses a first phonon frequency range, a second crystalline layer that has a second phonon frequency range which does not overlap with the first phonon frequency range, and an amorphous layer located between the first and second crystalline layers. The amorphous layer has a third phonon frequency range that overlaps both the first and second phonon frequency ranges.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HUANG, Jhih-Rong Hsinchu County, TW 16 4
LIAO, Szuya Hsinchu County, TW 59 5
LIN, Han-Yu Nantou County, TW 48 35
SHIH, Che Chi Taoyuan City, TW 12 0
WOON, Wei-Yen Taoyuan City, TW 47 95
YANG, Ku-Feng Hsinchu County, TW 109 1959

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