MACHINE LEARNING MODELS FOR EXPOSURE DEFECT CLASSIFICATION IN IMAGES
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United States of America Patent
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Jan 23, 2025
app pub date -
Oct 7, 2024
filing date -
Oct 7, 2024
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Abstract
Models for classifying exposure defects in images are provided by training a binary model on a dataset of images labeled to indicate exposure within the images. When trained, the binary model classifies an image based on whether the image includes an exposure defect. A classification model is also trained. The classification model is trained on a dataset of images having exposure defects labeled to indicate exposure scores or exposure defect classifications. When trained, the classification model classifies the image based on a level of exposure. The binary model and the classification model can be stored for identifying and classifying exposure defects within images.
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