METHOD AND SYSTEM FOR ATOMIC INTERFEROMETRY
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United States of America Patent
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Issued Date -
Jan 23, 2025
app pub date -
Jul 17, 2024
filing date -
Jul 17, 2024
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Abstract
An atomic interferometer system comprises optical tweezers each configured to trap at least one atom therein, an atom source system configured to release atoms, and a controller configured to control the optical tweezers to trap at least one atom released by the atom source system in one of the tweezers, to spatially split a wave function of the trapped atom between at least two of the tweezers, and to at least partially recombine the split atomic wave function in at least one of the tweezers. The atomic interferometer system can also comprise a measuring system configured to measure wavefunction population in each of the tweezers and to display an output pertaining to the wavefunction populations.
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