CMP SLURRIES

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United States of America Patent

APP PUB NO 20250026961A1
SERIAL NO

18909483

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Abstract

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The present technology generally relates to compositions and methods for polishing surfaces comprising a metal and a dielectric film material. Embodiments include methods for polishing a surface comprising W, TEOS/SiO2 and SiN, comprising applying a polishing slurry comprising an abrasive, a SiN polishing rate enhancer, and an anionic surfactant, and methods of buffering a metal oxide salt in a CMP slurry to obtain an increased robustness against TEOS removal comprising polishing a surface comprising a metal and TEOS by applying a polishing slurry comprising an anionic modified colloidal silica abrasive and an anionic surfactant.

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Patent Owner(s)

Patent OwnerAddress
FUJIMI INCORPORATEDNISHIKASUGAI-GUN AICHI-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Granstrom, Jimmy Tualatin, US 9 37
Takeda, Hisashi Tualatin, US 21 197

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