SUBSTRATE PROCESS OPERATION ANALYSIS APPLICATION AND GENERATION OF VISUALIZATIONS

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United States of America

APP PUB NO 20240427308A1
SERIAL NO

18213790

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Abstract

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A method includes receiving data indicative of a range of processing conditions associated with a plurality of substrate processing operations. The data indicative of the range of processing conditions includes a first range of values of a first property and a second range of values of a second property of the processing conditions. The method further includes receiving data indicative of processing performance associated with the plurality of processed substrates. The data includes a first set of data associated with a first indication of substrate performance and a second set of data associated with a second indication of substrate performance. The method further includes performing analysis relating the processing conditions to the processing performance. The method further includes generating a visualization presenting results of the analysis including representations of the first indication of substrate performance and the second indication of substrate performance.

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APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Han, Zhenxing Sunnyvale, US 15 13
Kumar, Pardeep Greater Noida, IN 27 40
Nandan, Rituraj Milpitas, US 6 1
Narayanan, Sundar Cupertino, US 43 303
Sachan, Madhur Singh Belmont, US 2 0
Sanchez, Martha Inez Menlo Park, US 4 11
Schroeder, Brett Robert Portland, US 2 1
Subramanian, Ramachandran Chennai, IN 54 978
Sundar, Bharath Ram Chennai, IN 7 22

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