OPEN BLOCK DETECTION METHOD USING FOR FIRST AND SECOND TIME PERIOD READ TIME VALLEY FOR NON-VOLATILE MEMORY APPARATUS

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United States of America

APP PUB NO 20240420775A1
SERIAL NO

18230270

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Abstract

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A memory apparatus and method of operation are provided. The apparatus includes memory cells configured to retain a threshold voltage corresponding to one of a plurality of data states. The memory cells are disposed in memory holes grouped in blocks. A control means is configured to determine an amount of the memory cells of one of the blocks that are programmed during at least one read operation. The control means adjusts at least one read parameter based on the amount of the memory cells of the one of the blocks that are programmed. The control means is also configured to utilize the adjusted at least one read parameter while reading the memory cells to determine if the memory cells have the threshold voltage above one or more read levels associated with each of the plurality of data states in the at least one read operation.

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Patent Owner(s)

Patent OwnerAddress
SANDISK TECHNOLOGIES INC951 SANDISK DRIVE LEGAL DEP MILPITAS CA 95035

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Albert Milpitas, US 72 819
Fu, Eric Sunnyvale, US 4 11
Fu, Jiahui Fremont, US 3 0
Yang, Xiang Santa Clara, US 247 576

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