Method for training Machine learning system, method for generating resulting microscope image with a machine learning system, computer program product, and image processing system

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United States of America

APP PUB NO 20240412851A1
SERIAL NO

18732764

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Abstract

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A method for training a machine learning system having a processing model for a sample type, which processes microscope images of samples of the sample type by virtual processing mapping, comprising recording at least one fine stack of a sample of the sample type, wherein the at least one fine stack comprises microscope images of the sample registered with respect to one another, determining at least one target microscope image based on the fine stack and the virtual processing mapping, creating an annotated data set comprising at least the target microscope image and a learning microscope image, wherein the learning microscope image is based on a coarse stack capturing the sample coarser than the fine stack, optimizing the processing model on the basis of the annotated data set.

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Patent Owner(s)

Patent OwnerAddress
CARL ZEISS MICROSCOPY GMBHCARL-ZEISS-PROMENADE 10 07745 JENA 07745

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Amthor, Manuel Jena, DE 79 68
Doering, Volker Jena, DE 5 1
Haase, Daniel Jena, DE 89 114
Neumann, Markus Jena, DE 28 170

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