Reliable Programming of One-Time Programmable (OTP) Memory During Device Testing
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United States of America
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Dec 12, 2024
app pub date -
Jun 11, 2023
filing date -
Jun 11, 2023
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Abstract
A method includes providing one or more signals to an electronic device for performing a test procedure that involves programming a One-Time Programmable (OTP) memory in the electronic device. A verification is made as to whether connection of the one or more signals to the electronic device is stable, by performing a sequence of one or more iterations, each iteration including (i) determining, from among a set of scratchpad addresses in the OTP memory, an address that is available for programming, (ii) writing a test value to the address, and then (iii) reading the test value from the address. If the read test value differs from the written test value, re-tuning of the connection of the one or more signals is initiated. Only when the connection is verified as stable by the sequence of iterations, the OTP memory is programmed in accordance with the test procedure.
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