Importance

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Abstract

The present invention provides a defect classification system including imaging means for causing an imaging device to image paper that has passed through a dry part and acquiring image data obtained by the imaging, detection means for detecting a defect in the paper in the image data, extraction means for extracting a feature amount of the defect, calculation means for causing a classification model in which a reference feature amount is previously set to calculate a certainty factor in a defect cause item on the basis of the feature amount of the defect, and display means for displaying the certainty factor, in which the classification model is caused to learn the reference feature amount using machine learning from a relationship between respective feature amounts of defects previously stored and a plurality of defect cause items.

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First Claim